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ISBN:0819445495
Author: Andreas K. Freund,Albert T. Macrander,Tetsuya Ishikawa,James L. Wood
ISBN13: 978-0819445490
Title: X-ray Mirrors, Crystals, and Multilayers II (Proceedings of Spie)
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Language: English
Category: Engineering
Publisher: Society of Photo Optical (December 24, 2002)
Pages: 322

X-ray Mirrors, Crystals, and Multilayers II (Proceedings of Spie) by Andreas K. Freund,Albert T. Macrander,Tetsuya Ishikawa,James L. Wood



PROCEEDINGS VOLUME 4782. This achromatic focusing device delivers the beam to a micrometer-scale, high photon density spot, which is the source for a Spectroscopic Photoemission and Low Energy Electron Microscope (SPELEEM).

Challenges for synchrotron x-ray optics. Author(s): Andreas K. Freund. Date Published: 24 December 2002 PDF: 11 pages Proc. SPIE 4782, X-Ray Mirrors, Crystals, and Multilayers II, (24 December 2002); doi: 1. 117/12. Show Author Affiliations. Andreas K. Freund, European Synchrotron Radiation Facility (France).

X Ray Mirrors, Crystal. by Andreas K. See a Problem? We’d love your help. Published January 1st 2002 by SPIE-International Society for Optical Engineering. X-Ray Mirrors, Crystals, and Multilayers II (Proceedings of SPIE). 0819445495 (ISBN13: 9780819445490). This book is not yet featured on Listopia.

Proceedings of SPIE the International Society for Optical Engineering ; v. 4501. Rubrics: X-ray optics Congresses Mirrors Crystal optics Thin films, Multilayered. On this site it is impossible to download the book, read the book online or get the contents of a book. The administration of the site is not responsible for the content of the site. The data of catalog based on open source database. All rights are reserved by their owners.

X-ray mirrors, crystals, and multilayers. Freund, Tetsuya Ish. X-ray mirrors, crystals, and multilayers Close. Are you sure you want to remove X-ray mirrors, crystals, and multilayers from your list? X-ray mirrors, crystals, and multilayers. 30-31 July 2001, San Diego, USA. Published 2001 by SPIE-International Society for Optical Engineering in Bellingham, Wash.

Proceedings 11 pages. Download PDF + save to my library. Freund, "Challenges for synchrotron x-ray optics," Proc. SPIE 4782, X-Ray Mirrors, Crystals, and Multilayers II, (24 December 2002); Include: Citation Only.

X-ray reflectivity of the multilayers has been measured in the photon energy range from ~. 8keV to ~100keV. W/B4C structures with d~. nm showed reflectivity greater than 30% at Cu-Kα (E~8keV).

David D. Allred, Matthew B. Squires, R. Steven Turley, Webster Cash, and Ann Shipley, "Highly Reflective Uranium Mirrors for Astrophysics Applications," in X-ray Mirrors, Crystals and Multilayers, Andreas K. Freund, Albert T. Macrander, Tetsuya Ishikawa, and James. SPIE 4782, pp 212-223, SPIE, Bellingham, WA, 2003. M. B. Squires, David D. Allred and R. Steven Turley, "The Optical Constants of Sputtered U and a Si at 3. and 5. nm," J. of the Utah Academy of Arts, Sciences and Letters-1999, 76, 74-87 (2002). Thorne, "Deposition of Zinc Selenide by Atomic Layer Epitaxy for Multilayer X-Ray Optics," in Properties of II-VI Semiconductors: Bulk Crystals, Epitaxial Films, Quantum Well Structures, and Dilute Magnetic Systems, .

Solid State Lighting II (Proceedings of Spie) EAN 978081944. 31 руб. Applications and Science of Neural Networks, Fuzzy Systems, and Evolutionary Computation V (Proceedings of Spie) EAN 978081944. 85 руб. Low-light-level and Real-time Imaging Systems, Components, and Applications (Proceedings of Spie) EAN 978081944. 23 руб. Liquid Crystals VI (Proceedings of Spie) EAN 978081944. Contact us. We dont sell nor produce nor supply.

X-ray mirrors, crystals, and multilayers II : 10 - 11 July 2002, Seattle, Washington, USA, Conference on X-Ray Mirrors, Crystals, and Multilayers II held as part of the SPIE 47th annual meeting and 2002 International Symposium on Optical Science and Technology Bellingham/Wash. SPIE, 2002 (SPIE Proceedings Series 4782) ISBN: 0-8194-4549-5 p. 85-291. Conference on X-Ray Mirrors, Crystals, and Multilayers <2, 2002, Seattle/Wash. International Symposium on Optical Science and Technology <2002, Seattle/Wash. SPIE Annual Meeting <47, 2002, Seattle/Wash.