» » High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science)
Download High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science) epub book
ISBN:3642075258
Author: Frank Ernst,Manfred Rühle
ISBN13: 978-3642075254
Title: High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science)
Format: azw mobi lrf docx
ePUB size: 1545 kb
FB2 size: 1565 kb
DJVU size: 1587 kb
Language: English
Category: Engineering
Publisher: Springer; Softcover reprint of hardcover 1st ed. 2003 edition (December 7, 2010)
Pages: 442

High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science) by Frank Ernst,Manfred Rühle



The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic. Table of contents (10 chapters). Bibliographic Information. High-Resolution Imaging and Spectrometry of Materials. Springer Series in Materials Science.

The Springer Series in Materials Science covers the complete spectrum of materials physics, including fundamental principles, physical properties, materials theory and design. Recognizing the increasing importance of materials science in future device technologies, the book titles in this series reflect the state-of-the-art in understanding and controlling the structure and properties of all important classes of materials. F. Ernst M. Ruhle (Ed. High-Resolution Imaging and Spectrometry of Materials With 211 Figures Including 32 Color Figures, Springer. Dr. Frank Ernst Department of Materials Science and Engineering Case Western Reserve University 414 White Building 10900 Euclid Avenue, Cleveland, OH 44106-7204, USA. Professor Manfred Riihle MPI fUr Materialforschung Heisenbergstrasse 3, 70569 Stuttgart, Germany.

Frank Ernst, Manfred Rühle. The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces.

2010 Серия: Springer Series in Materials Science Язык: ENG Размер: 2. 1 x 1. 4 x . 4 cm Основная тема: Materials Science Рейтинг: Поставляется из: Германии Описание: The characterisation of materials and material systems is an essential aspect of materials science. Описание: The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots.

Start by marking High-Resolution Imaging and Spectrometry of Materials as Want to Read: Want to Read savin. ant to Read. This means that the position - as well as the nature - of individual at The characterisation of materials and material systems is an essential aspect of materials science

Published January 31, 2003 by Springer. No material has a perfect structure.

Springer series in materials science, 0933-033X ; 50. Bibliography, etc. Note: Includes bibliographical references and index. Summary, et. "This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented.

High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science). The book provides a valuable snapshot as at early 2000 of the range of diverse approaches, both theoretical and experimental, being applie. y some of the leading practitioners in this field. It would be of interest to scientists and engineers with a specialist’s interest in this or related interfaces. M. A. Green, The Physicist, Vol. 38 (6), 2001). Series: Springer Series in Materials Science (Book 46).

The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma­ terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.