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ISBN:1441909303
Author: Rajesh Garg
ISBN13: 978-1441909305
Title: Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations
Format: mbr lrf txt azw
ePUB size: 1765 kb
FB2 size: 1390 kb
DJVU size: 1790 kb
Language: English
Category: Engineering
Publisher: Springer; 2010 edition (November 16, 2009)
Pages: 212

Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations by Rajesh Garg



This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems  . 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits. Garg, Rajesh (et a. Pages 71-86. Process Variation Tolerant Single-supply True Voltage Level Shifter. Pages 173-188.

Analysis and design of resilient VLSI circuits: Mitigating soft errors and process variations. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems Jan 2010. Analysis and Design of Resilient VLSI Circuits.

Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. Among these noise sources, soft errors (or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as combinational logic circuits. Also, in the DSM era, process variations are increasing at an alarming rate, making it more difficult to design reliable VLSI circuits. The work presented in this dissertation presents several analysis and design techniques with the goal of realizing VLSI circuits which are tolerant to radiation particle strikes and process variations. This dissertation consists of two parts. The first part proposes four analysis and two design approaches to address radiation particle strikes.

Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations.

This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems. My blog on AH. Not all books on AvaxHome appear on the homepage.

This book describes the design of resilient VLSI circuits, presenting algorithms and techniques to analyze and mitigate design problems. The Law Relating to Authors and Publishers by Cloutman, Brett Mackay, 1891, modern web browsers have become the application platform of choice.

Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis meth. 20. Rajesh Garg, Sunil P. Khatri, Analysis and Design of Resilient VLSI Circuits, pp. 131, 2010. 21. V. Migairou, R. Wilson, S. Engels, N. Azemard, P. Maurine, Integrated Circuit and System Design.

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.