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ISBN:9812389407
Author: Daniel M. Fleetwood
ISBN13: 978-9812389404
Title: Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected topics in Electronics and Systems)
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ePUB size: 1711 kb
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Language: English
Category: Engineering
Publisher: Wspc (July 29, 2004)
Pages: 348

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected topics in Electronics and Systems) by Daniel M. Fleetwood



This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal–oxide–semiconductor (MOS), and compound semiconductor technologies are discussed

Nation effects and soft errors I ntegrated circuits electro, : Radiation effects and soft errors in integrated circuits and electronic devices. This book, or parts thereof, may not be reproduced in anyform or by any means, electronic or mechanical, including photocopying, recording or any information storage and retrieval system now known or to be invented, without written permission from the Publisher.

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles and effects produced by the cumulative energy deposited by the radiation. ~~DOWNLOAD~~~ Nitroflare. Скачать с помощью Mediaget.

Radiation-hardened products are typically tested to one or more resultant effects tests, including total ionizing dose (TID), enhanced low dose rate effects (ELDRS), neutron and proton displacement damage, and single event effects (SEE, SET, SEL and SEB). 1 Problems caused by radiation. Schrimpf, Ronald . Fleetwood, Daniel M. (July 2004). Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Selected Topics in Electronics and Systems. 34. World Scientific. ISBN 978-981-238-940-4. Radiation Effects in Electronic Materials and Devices". In Meyers, Robert A. Encyclopedia of Physical Science and Technology.

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. Bipolar (Si This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft e. Technology Nonfiction.

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems) by Daniel M. Fleetwood and R. D. Schrimpf (Hardcover - Aug 30, 2004). Advances in Silicon Carbide Processing and Applications (Semiconductor Materials and Devices Series) by Stephen E. Saddow and Anant Agarwal (Hardcover - Jul 2004). Predictive Simulation of Semiconductor Processing: Status and Challenges (Springer Series in Materials Science) by Jarek Dabrowski and Eicke R. Weber (Hardcover - Jun 24, 2004).

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (Mos), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.